You are currently visiting the website in English. Information of the German variant is now shown.

NBN EN IEC 60749-23:2026

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur

ACTIVE

Languages: English and French
Type: NBN Electro
Status: ACTIVE
Publication date: 31 January 2026
Replaces: NBN EN 60749-23/A1:2011
ICS Code: 31.080.01 (Semiconductor devices in general)
Withdrawn Date
Price: € 37,00