Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods
This standard describes methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer. It includes details of sample preparation and general principles for qualitative and quantitative analysis of mineralogical phase composition. Quantitative determination of -Si3N4, -Si3N4, Si2ON2, AlN, and SiAlON are described.NOTE For the refinement procedures the total nitrogen content, analysed in accordance with EN 12698-1 is needed.
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